Surface Recombination Via Interface Defects in Field Effect Transistors
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Active and Passive Electronic Components
سال: 1998
ISSN: 0882-7516,1563-5031
DOI: 10.1155/1998/91648